Engineering & Materials Science
Oxides
100%
Transistors
80%
Hot carriers
74%
Dosimetry
71%
Bipolar transistors
61%
Degradation
58%
Networks (circuits)
54%
Threshold voltage
54%
Radiation
52%
Resistors
48%
Substrates
46%
Electric potential
45%
Liquid nitrogen
42%
Capacitors
39%
Analog circuits
37%
Cryogenics
35%
Ionizing radiation
31%
Screening
31%
Packaging
29%
Electronic equipment
28%
Oxygen
26%
Silicon
26%
Lasers
25%
Temperature
22%
Voltage measurement
20%
Analytical models
18%
Low temperature operations
16%
Signal processing
13%
Pipe
12%
Electric breakdown
12%
Silicon oxides
12%
Irradiation
11%
Masks
10%
Doping (additives)
9%
Hardness
8%
Fabrication
8%
Contamination
8%
Surface roughness
6%
Defects
5%
Data storage equipment
5%
Chemical Compounds
Length
72%
Voltage
68%
Velocity
55%
Ionizing Radiation
40%
Cryogenics
36%
Implant
32%
Current Gain
29%
Dose
25%
Breakdown Voltage
24%
Oxide
17%
Dioxygen
16%
Nitrogen
13%
Liquid
12%
Application
10%
Silicon Oxide
10%
Ambient Reaction Temperature
9%
Compound Mobility
8%
Surface
5%
Physics & Astronomy
CMOS
89%
cryogenics
31%
degradation
25%
scaling
23%
dosage
22%
threshold voltage
18%
radiation
18%
saturation
17%
liquid nitrogen
16%
oxides
12%
performance
11%
inverters
10%
propagation
9%
shift
8%
rooms
7%
transistors
5%
hardness
5%
augmentation
5%