Research output per year
Research output per year
Search results
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2023
Overview of Recent Advancements in Deep Learning and Artificial Intelligence
Narayanan, V., Cao, Y., Panda, P., Challapalle, N. R., Du, X., Kim, Y., Krishnan, G., Lee, C., Li, Y., Sun, J., Venkatesha, Y., Wang, Z. & Zheng, Y., Jan 1 2023, Advances in Electromagnetics Empowered by Artificial Intelligence and Deep Learning. Wiley, p. 23-79 57 p.Research output: Chapter in Book/Report/Conference proceeding › Chapter
Open Access -
2017
Heterogeneous memory design
Yang, C., Xu, Z., Chakrabarti, C. & Cao, Y., Jan 1 2017, VLSI: Circuits for Emerging Applications. CRC Press, p. 407-427 21 p.Research output: Chapter in Book/Report/Conference proceeding › Chapter
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2015
Compact modeling of BTI for circuit reliability analysis
Sutaria, K. B., Velamala, J. B., Ramkumar, A. & Cao, Y., Jan 1 2015, Circuit Design for Reliability. Springer New York, p. 93-119 27 p.Research output: Chapter in Book/Report/Conference proceeding › Chapter
12 Scopus citations -
Introduction
Reis, R., Cao, Y. & Wirth, G., Jan 1 2015, Circuit Design for Reliability. Springer New York, p. 1-4 4 p.Research output: Chapter in Book/Report/Conference proceeding › Chapter
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2014
Charge trapping in MOSFETS: BTI and RTN modeling for circuits
Wirth, G., Cao, Y., Velamala, J. B., Sutaria, K. B. & Sato, T., Jul 1 2014, Bias Temperature Instability for Devices and Circuits. Springer New York, Vol. 9781461479093. p. 751-782 32 p.Research output: Chapter in Book/Report/Conference proceeding › Chapter
4 Scopus citations -
Multilevel reliability simulation for IC design
Sutaria, K. B., Velamala, J. B., Ravi, V., Wirth, G., Sato, T. & Cao, Y., Jul 1 2014, Bias Temperature Instability for Devices and Circuits. Springer New York, Vol. 9781461479093. p. 719-749 31 p.Research output: Chapter in Book/Report/Conference proceeding › Chapter
3 Scopus citations -
2012
On-Chip Spiral Inductors with Integrated Magnetic Materials
Xu, W., Sinha, S., Wu, H., Dastagir, T., Cao, Y. & Yu, H., May 7 2012, Advanced Circuits for Emerging Technologies. John Wiley and Sons, p. 439-462 24 p.Research output: Chapter in Book/Report/Conference proceeding › Chapter
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2011
Compact modeling for NBTI and CHC effects
Wang, W., Reddy, V., Krishnan, S. & Cao, Y., 2011, Recent Topics on Modeling of Semiconductor Processes, Devices, and Circuits. Bentham Science Publishers Ltd., p. 40-60 21 p.Research output: Chapter in Book/Report/Conference proceeding › Chapter
1 Scopus citations