Project Details
Description
Electromigration Lifetime Characterization under Realistic Chip Operating Conditions
| Status | Active |
|---|---|
| Effective start/end date | 1/1/24 → 12/31/24 |
Funding
- UNIVERSITY OF TEXAS AT DALLAS
- SEMICONDUCTOR RESEARCH CORPORATION
Fingerprint
Explore the research topics touched on by this project. These labels are generated based on the underlying awards/grants. Together they form a unique fingerprint.