Acquisition of a Powder X-Ray Diffractometer with Thin Film and In-Situ High Temperature Capabilities

CTS-9512485 Tsapatsis U of Massachusetts A Powder X-ray Diffractometer (PXRD) will be procured for research in material characterization. The PXRD will have capabilities for in situ high temperature, controlled environment and thin film XRD. Uses for the equipment include characterization of synthetic zeolites, polymeric materials and amphiphilic association structures, as well as identification of layered silicates and other minerals in geological samples. It will support various research projects in advanced materials processing and manufacturing. The PXRD will also be used for training of graduate students.