A 16nm All-Digital Hardware Monitor for Evaluating Electromigration Effects in Signal Interconnects Through Bit-Error-Rate Tracking

Nakul Pande, Chen Zhou, Ming Hsien Lin, Rita Fung, Richard Wong, Shi Jie Wen, Chris H. Kim

Research output: Contribution to journal › Article › peer-review

2 Scopus citations

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Engineering & Materials Science

Chemical Compounds