TY - GEN
T1 - An all-in-one silicon odometer for separately monitoring HCI, BTI, and TDDB
AU - Keane, John
AU - Persaud, Devin
AU - Kim, Chris H.
PY - 2009/11/18
Y1 - 2009/11/18
N2 - An on-chip reliability monitor capable of separating the aging effects of HCI, BTI, and TDDB with sub-ps precision is presented. A pair of stressed ring oscillators is implemented in which one ages due to both BTI and HCI, while the other suffers from only BTI. Frequency degradation is monitored with a beat frequency detection system achieving sub-μs measurement times. Measurement results are presented from a 65nm test chip over a range of stress conditions.
AB - An on-chip reliability monitor capable of separating the aging effects of HCI, BTI, and TDDB with sub-ps precision is presented. A pair of stressed ring oscillators is implemented in which one ages due to both BTI and HCI, while the other suffers from only BTI. Frequency degradation is monitored with a beat frequency detection system achieving sub-μs measurement times. Measurement results are presented from a 65nm test chip over a range of stress conditions.
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M3 - Conference contribution
AN - SCOPUS:70449348020
SN - 9784863480018
T3 - IEEE Symposium on VLSI Circuits, Digest of Technical Papers
SP - 108
EP - 109
BT - 2009 Symposium on VLSI Circuits
T2 - 2009 Symposium on VLSI Circuits
Y2 - 16 June 2009 through 18 June 2009
ER -