Black-Box Testing of Deep Neural Networks

Research output: Chapter in Book/Report/Conference proceedingConference contribution

5 Scopus citations

Abstract

Several test adequacy criteria have been developed for quantifying the the coverage of deep neural networks (DNNs) achieved by a test suite. Being dependent on the structure of the DNN, these can be costly to measure and use, especially given the highly iterative nature of the model training workflow. Further, testing provides higher overall assurance when such implementation dependent measures are used along with implementation independent ones. In this paper, we rigorously define a new black-box coverage criterion that is independent of the DNN model under test. We further describe a few desirable properties and associated evaluation metrics for assessing test coverage criteria and use those to empirically compare and contrast the black-box criterion with several DNN structural coverage criteria. Results indicate that the black-box criterion has comparable effectiveness and provides benefits that complement white-box criteria. The results also reveal a few weaknesses of coverage criteria for DNNs.

Original languageEnglish (US)
Title of host publicationProceedings - 2021 IEEE 32nd International Symposium on Software Reliability Engineering, ISSRE 2021
EditorsZhi Jin, Xuandong Li, Jianwen Xiang, Leonardo Mariani, Ting Liu, Xiao Yu, Nahgmeh Ivaki
PublisherIEEE Computer Society
Pages309-320
Number of pages12
ISBN (Electronic)9781665425872
DOIs
StatePublished - 2021
Event32nd IEEE International Symposium on Software Reliability Engineering, ISSRE 2021 - Wuhan, China
Duration: Oct 25 2021Oct 28 2021

Publication series

NameProceedings - International Symposium on Software Reliability Engineering, ISSRE
Volume2021-October
ISSN (Print)1071-9458

Conference

Conference32nd IEEE International Symposium on Software Reliability Engineering, ISSRE 2021
Country/TerritoryChina
CityWuhan
Period10/25/2110/28/21

Bibliographical note

Funding Information:
This work was supported by AFRL and DARPA under contract FA8750-18-C-0099.

Publisher Copyright:
© 2021 IEEE.

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