Abstract
Direct evidence for charge leakage at the interface of epitaxial SrTiO 3/LaMnO3 superlattices with atomically sharp interfaces is provided. The direction of charge leakage can be reversed by changing the LMO/STO thickness ratio. This result will be important for the understanding of some of the reported limitations of oxide devices involving manganite/titanate interfaces.
Original language | English (US) |
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Pages (from-to) | 627-632 |
Number of pages | 6 |
Journal | Advanced Materials |
Volume | 22 |
Issue number | 5 |
DOIs | |
State | Published - Feb 2 2010 |