Comparison of Eigenmode-Based and random field-based imperfection modeling for the stochastic buckling analysis of I-Section Beam-Columns

A. Stavrev, D. Stefanov, D. Schillinger, E. Rank

Research output: Contribution to journalArticlepeer-review

4 Scopus citations

Fingerprint

Dive into the research topics of 'Comparison of Eigenmode-Based and random field-based imperfection modeling for the stochastic buckling analysis of I-Section Beam-Columns'. Together they form a unique fingerprint.

Mathematics

Engineering & Materials Science