Critical length scales for chemical heterogeneity at Cu/Nb 3D interfaces by atom probe tomography

Zezhou Li, Justin Y. Cheng, Jonathan D. Poplawsky, Shuozhi Xu, Jon K. Baldwin, Irene J. Beyerlein, Nathan A. Mara

Research output: Contribution to journalArticlepeer-review

4 Scopus citations

Abstract

Cu/Nb nanocomposites containing sharp, two-dimensional (2D) interfaces have outstanding strength but limited deformability. In contrast, Cu/Nb with three dimensional (3D) biphase interfaces exhibiting crystallographic, topological, and chemical variations in all spatial dimensions overcomes this limitation by simultaneously enhancing material strength and deformability. While structural characterization of 3D interfaces has been performed to understand their mechanical behavior, three dimensional chemical characterization of such interfaces is lacking. In this work we quantify the local chemistry of 3D interfaces in Cu/Nb nanocomposites using atom probe tomography (APT). Our analysis demonstrates chemical heterogeneities along all spatial dimensions in 3D interfaces, establishes the length scale of such features, and quantifies the morphology of 3D interfaces. 3D interface heterogeneities form by surface diffusion during physical vapor deposition (PVD), suggesting that deposition parameters can be used to control interface structure and provide unique ways to explore processing-structure-property relationships in interface-dominated nanocomposites.

Original languageEnglish (US)
Article number115078
JournalScripta Materialia
Volume223
DOIs
StatePublished - Jan 15 2023
Externally publishedYes

Bibliographical note

Publisher Copyright:
© 2022

Keywords

  • 3D interfaces
  • Atom probe tomography
  • Cu/Nb nanolaminates
  • Physical vapor deposition
  • Surface diffusion

Fingerprint

Dive into the research topics of 'Critical length scales for chemical heterogeneity at Cu/Nb 3D interfaces by atom probe tomography'. Together they form a unique fingerprint.

Cite this