Abstract
We share our perspective that a simple analytical model for electron tunneling in molecular junctions can greatly aid quantitative analysis of experimental data in molecular electronics. In particular, the single-level model (SLM), derived from first principles, provides a precise prediction for the current-voltage (I-V) characteristics in terms of key electronic structure parameters, which in turn depend on the molecular and contact architecture. SLM analysis thus facilitates understanding of structure-property relationships and provides metrics that can be compared across different types of tunnel junctions, as we illustrate with several examples.
Original language | English (US) |
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Pages (from-to) | 32305-32316 |
Number of pages | 12 |
Journal | Physical Chemistry Chemical Physics |
Volume | 25 |
Issue number | 47 |
DOIs | |
State | Published - Nov 14 2023 |
Bibliographical note
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