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Defect structures at thin film-substrate interfaces
Jinfu Hu,
P. H. Leo
Aerospace Engineering and Mechanics
Research output
:
Contribution to journal
›
Article
›
peer-review
9
Scopus citations
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Engineering & Materials Science
Defect structures
100%
Thin films
59%
Substrates
44%
Interfacial energy
26%
Free energy
25%
Film thickness
22%
Defects
14%
Physics & Astronomy
defects
35%
thin films
32%
interfacial energy
15%
film thickness
10%
free energy
10%
flux density
10%
gradients
8%
symmetry
7%
energy
3%