Abstract
Elastic deformation on the surfaces of molecular crystals can be imaged using a variant of lateral force microscopy in which the tip is scanned parallel to the cantilever axis. The shear force transverse to this direction has a distinctly different origin than the friction force as determined by the tip velocity and temperature dependence of the cantilever torque. An elastic deformation model for the tip-sample interaction predicts the crystallographic anisotropy of the transverse shear contrast, establishing its connection with the relative magnitude of the in-plane elastic tensor components.
Original language | English (US) |
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Article number | 086102 |
Journal | Physical review letters |
Volume | 104 |
Issue number | 8 |
DOIs | |
State | Published - Feb 26 2010 |