Original language | Undefined/Unknown |
---|---|
State | Published - 2013 |
Efficient Test Coverage Measurement for MC/DC
Michael W. Whalen, Mats P.E. Heimdahl, Ian J. De Silva
Research output: Working paper
Michael W. Whalen, Mats P.E. Heimdahl, Ian J. De Silva
Research output: Working paper
Original language | Undefined/Unknown |
---|---|
State | Published - 2013 |