Electron doping by charge transfer at LaFeO3/Sm 2CuO4 epitaxial interfaces

Flavio Y. Bruno, Rainer Schmidt, Maria Varela, Javier Garcia-Barriocanal, Alberto Rivera-Calzada, Fabian A. Cuellar, Carlos Leon, Pardeep Thakur, Julio C. Cezar, Nicholas B. Brookes, Mar Garcia-Hernandez, Elbio Dagotto, Stephen J. Pennycook, Jacobo Santamaria

Research output: Contribution to journalArticlepeer-review

9 Scopus citations

Abstract

Using X-ray absorption spectroscopy and electron energy loss spectroscopy with atomic-scale spatial resolution, experimental evidence for charge transfer at the interface between the Mott insulators Sm2CuO4 and LaFeO3 is obtained. As a consequence of the charge transfer, the Sm2CuO4 is doped with electrons and thus epitaxial Sm 2CuO4/LaFeO3 heterostructures become metallic.

Original languageEnglish (US)
Pages (from-to)1468-1473
Number of pages6
JournalAdvanced Materials
Volume25
Issue number10
DOIs
StatePublished - Mar 13 2013

Keywords

  • charge transfer
  • interface phenomena
  • superlattices

Fingerprint

Dive into the research topics of 'Electron doping by charge transfer at LaFeO3/Sm 2CuO4 epitaxial interfaces'. Together they form a unique fingerprint.

Cite this