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Experimental Validation of a Novel Methodology for Electromigration Assessment in On-Chip Power Grids
Valeriy Sukharev, Armen Kteyan, Farid N. Najm, Yong Hyeon Yi, Chris H. Kim, Jun Ho Choy, Sofya Torosyan, Yu Zhu
Research output: Contribution to journal › Article › peer-review
1
Scopus
citations