TY - GEN
T1 - Fast and accurate estimation of nano-scaled SRAM read failure probability using Critical Point Sampling
AU - Chang, Ik Joon
AU - Kang, Kunhyuk
AU - Mukhopadhyay, Saibal
AU - Kim, Chris H.
AU - Roy, Kaushik
PY - 2005
Y1 - 2005
N2 - Variability in process parameters is making accurate estimate of nano-scale SRAM stability an extremely challenging task. In this paper, we propose a new method to detect the read failure in a SRAM cell using Critical Point Sampling technique. Using this technique, we propose two types of read failure probability estimation method, (1) quasi-analytical and (2) completely analytical method. The result shows that our proposed model can achieve high accuracy, while being 20X faster in computational speed. Our method can be applied to different phases of design to reduce the overall design time, and can be used for optimizing the given design in order to obtain a better yield.
AB - Variability in process parameters is making accurate estimate of nano-scale SRAM stability an extremely challenging task. In this paper, we propose a new method to detect the read failure in a SRAM cell using Critical Point Sampling technique. Using this technique, we propose two types of read failure probability estimation method, (1) quasi-analytical and (2) completely analytical method. The result shows that our proposed model can achieve high accuracy, while being 20X faster in computational speed. Our method can be applied to different phases of design to reduce the overall design time, and can be used for optimizing the given design in order to obtain a better yield.
UR - http://www.scopus.com/inward/record.url?scp=33847100084&partnerID=8YFLogxK
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U2 - 10.1109/CICC.2005.1568700
DO - 10.1109/CICC.2005.1568700
M3 - Conference contribution
AN - SCOPUS:33847100084
SN - 0780390237
SN - 9780780390232
T3 - Proceedings of the Custom Integrated Circuits Conference
SP - 439
EP - 442
BT - Proceedings of the IEEE 2005 Custom Integrated Circuits Conference
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - IEEE 2005 Custom Integrated Circuits Conference
Y2 - 18 September 2005 through 21 September 2005
ER -