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Histologic analysis of a 2,940 nm fractional device
David A. Kist, Courtney M.L. Elm, Lydia I. Eleftheriou, Jessica A. Studer, Irmina D. Wallander, Susan E. Walgrave, Brian D. Zelickson
Research output: Contribution to journal › Article › peer-review
10
Scopus
citations