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IFIZZ: Deep-State and Efficient Fault-Scenario Generation to Test IoT Firmware
Peiyu Liu, Shouling Ji, Xuhong Zhang, Qinming Dai, Kangjie Lu, Lirong Fu, Wenzhi Chen, Peng Cheng, Wenhai Wang, Raheem Beyah
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
6
Scopus
citations