Measurement of transient atomic displacements in thin films with picosecond and femtometer resolution

M. Kozina; T. Hu; J. S. Wittenberg; E. Szilagyi; M. Trigo; T. A. Miller; C. Uher; A. Damodaran; L. Martin; A. Mehta; J. Corbett; J. Safranek; D. A. Reis; A. M. Lindenberg

doi:10.1063/1.4875347

Measurement of transient atomic displacements in thin films with picosecond and femtometer resolution

M. Kozina, T. Hu, J. S. Wittenberg, E. Szilagyi, M. Trigo, T. A. Miller, C. Uher, A. Damodaran, L. Martin, A. Mehta, J. Corbett, J. Safranek, D. A. Reis, A. M. Lindenberg

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Abstract

We report measurements of the transient structural response of weakly photoexcited thin films of BiFeO₃, Pb(Zr,Ti)O₃, and Bi and time-scales for interfacial thermal transport. Utilizing picosecond x-ray diffraction at a 1.28MHz repetition rate with time resolution extending down to 15 ps, transient changes in the diffraction angle are recorded. These changes are associated with photo-induced lattice strains within nanolayer thin films, resolved at the part-per-million level, corresponding to a shift in the scattering angle three orders of magnitude smaller than the rocking curve width and changes in the interlayer lattice spacing of fractions of a femtometer. The combination of high brightness, repetition rate, and stability of the synchrotron, in conjunction with high time resolution, represents a novel means to probe atomic-scale, near-equilibrium dynamics.

Original language	English (US)
Article number	034301
Journal	Structural Dynamics
Volume	1
Issue number	3
DOIs	https://doi.org/10.1063/1.4875347
State	Published - May 1 2014
Externally published	Yes

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© 2014 Author(s).

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Kozina, M., Hu, T., Wittenberg, J. S., Szilagyi, E., Trigo, M., Miller, T. A., Uher, C., Damodaran, A., Martin, L., Mehta, A., Corbett, J., Safranek, J., Reis, D. A., & Lindenberg, A. M. (2014). Measurement of transient atomic displacements in thin films with picosecond and femtometer resolution. Structural Dynamics, 1(3), Article 034301. https://doi.org/10.1063/1.4875347

@article{906ee721480e4a81bb768b2d2577f1ca,

title = "Measurement of transient atomic displacements in thin films with picosecond and femtometer resolution",

abstract = "We report measurements of the transient structural response of weakly photoexcited thin films of BiFeO3, Pb(Zr,Ti)O3, and Bi and time-scales for interfacial thermal transport. Utilizing picosecond x-ray diffraction at a 1.28MHz repetition rate with time resolution extending down to 15 ps, transient changes in the diffraction angle are recorded. These changes are associated with photo-induced lattice strains within nanolayer thin films, resolved at the part-per-million level, corresponding to a shift in the scattering angle three orders of magnitude smaller than the rocking curve width and changes in the interlayer lattice spacing of fractions of a femtometer. The combination of high brightness, repetition rate, and stability of the synchrotron, in conjunction with high time resolution, represents a novel means to probe atomic-scale, near-equilibrium dynamics.",

author = "M. Kozina and T. Hu and Wittenberg, {J. S.} and E. Szilagyi and M. Trigo and Miller, {T. A.} and C. Uher and A. Damodaran and L. Martin and A. Mehta and J. Corbett and J. Safranek and Reis, {D. A.} and Lindenberg, {A. M.}",

note = "Publisher Copyright: {\textcopyright} 2014 Author(s).",

year = "2014",

month = may,

day = "1",

doi = "10.1063/1.4875347",

language = "English (US)",

volume = "1",

journal = "Structural Dynamics",

issn = "2329-7778",

publisher = "AAPM - American Association of Physicists in Medicine",

number = "3",

}

TY - JOUR

T1 - Measurement of transient atomic displacements in thin films with picosecond and femtometer resolution

AU - Kozina, M.

AU - Hu, T.

AU - Wittenberg, J. S.

AU - Szilagyi, E.

AU - Trigo, M.

AU - Miller, T. A.

AU - Uher, C.

AU - Damodaran, A.

AU - Martin, L.

AU - Mehta, A.

AU - Corbett, J.

AU - Safranek, J.

AU - Reis, D. A.

AU - Lindenberg, A. M.

PY - 2014/5/1

Y1 - 2014/5/1

N2 - We report measurements of the transient structural response of weakly photoexcited thin films of BiFeO3, Pb(Zr,Ti)O3, and Bi and time-scales for interfacial thermal transport. Utilizing picosecond x-ray diffraction at a 1.28MHz repetition rate with time resolution extending down to 15 ps, transient changes in the diffraction angle are recorded. These changes are associated with photo-induced lattice strains within nanolayer thin films, resolved at the part-per-million level, corresponding to a shift in the scattering angle three orders of magnitude smaller than the rocking curve width and changes in the interlayer lattice spacing of fractions of a femtometer. The combination of high brightness, repetition rate, and stability of the synchrotron, in conjunction with high time resolution, represents a novel means to probe atomic-scale, near-equilibrium dynamics.

AB - We report measurements of the transient structural response of weakly photoexcited thin films of BiFeO3, Pb(Zr,Ti)O3, and Bi and time-scales for interfacial thermal transport. Utilizing picosecond x-ray diffraction at a 1.28MHz repetition rate with time resolution extending down to 15 ps, transient changes in the diffraction angle are recorded. These changes are associated with photo-induced lattice strains within nanolayer thin films, resolved at the part-per-million level, corresponding to a shift in the scattering angle three orders of magnitude smaller than the rocking curve width and changes in the interlayer lattice spacing of fractions of a femtometer. The combination of high brightness, repetition rate, and stability of the synchrotron, in conjunction with high time resolution, represents a novel means to probe atomic-scale, near-equilibrium dynamics.

UR - http://www.scopus.com/inward/record.url?scp=84912007761&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84912007761&partnerID=8YFLogxK

U2 - 10.1063/1.4875347

DO - 10.1063/1.4875347

M3 - Article

AN - SCOPUS:84912007761

SN - 2329-7778

VL - 1

JO - Structural Dynamics

JF - Structural Dynamics

IS - 3

M1 - 034301

ER -

Measurement of transient atomic displacements in thin films with picosecond and femtometer resolution

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