Fingerprint
Dive into the research topics of 'Mobility scaling in short-channel length strained Ge-on-insulator P-MOSFETs'. Together they form a unique fingerprint.- Sort by
- Weight
- Alphabetically
Mobility scaling in short-channel length strained Ge-on-insulator P-MOSFETs
Stephen W. Bedell, Amlan Majumdar, John A. Ott, John Arnold, Keith Fogel, Steven J. Koester, Devendra K. Sadana
Research output: Contribution to journal › Article › peer-review
50
Scopus
citations