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Oscillating structure defects in dielectric diodes
W. C. Cheung, Brian G Van Ness
Genetics, Cell Biology and Development (TMED)
Research output
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peer-review
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Mathematics
Diode
87%
Metals
71%
Defects
63%
Fabrication
43%
Electrode
39%
Electric Field
35%
Conductivity
34%
Breakdown
33%
Electronics
33%
Elimination
30%
Oscillation
24%
Influence
24%
Physics & Astronomy
diodes
47%
porosity
45%
defects
35%
metals
32%
elimination
31%
electrical faults
31%
conductivity
20%
oscillations
19%
electrodes
19%
fabrication
19%
electric fields
18%
electronics
16%
Engineering & Materials Science
Defect structures
100%
Diodes
58%
Metals
40%
Electric fields
29%
Electrodes
24%
Fabrication
23%
Defects
21%