| Original language | English (US) |
|---|---|
| Pages (from-to) | 1588-1589 |
| Number of pages | 2 |
| Journal | Microscopy and Microanalysis |
| Volume | 20 |
| Issue number | 3 |
| DOIs | |
| State | Published - Aug 1 2014 |
| Event | Microscopy and Microanalysis 2014, M and M 2014 - Hartford, United States Duration: Aug 3 2014 → Aug 7 2014 |
Practical considerations for ultrashort electron pulse characterization in ultrafast transmission electron microscopy
Dayne Plemmons, David J. Flannigan
Research output: Contribution to journal › Conference article › peer-review