Abstract
Building upon recent advances in analog electronic design automation (EDA), this paper discusses directions for reinforcing the connection between design and EDA, in order to develop solutions that are meaningful to designers. Two aspects, both related to bridging the gap between EDA and designers, are highlighted. The first discusses the use of test structures to generate meaningful characterized data to aid design automation, specifically understanding the impact of random, correlated, and systematic variations on the design of matched structures. Results on a recent test chip that analyzes these variations and their impact on EDA design choices will be presented. The second illustrates a design testcase that applies analog EDA techniques, using the ALIGN layout engine, to design an RF MIMO receiver, and describes how this experience has helped both in advancing the state of analog EDA and in building circuits with enhanced designer productivity.
Original language | English (US) |
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Title of host publication | ASP-DAC 2024 - 29th Asia and South Pacific Design Automation Conference, Proceedings |
Publisher | Institute of Electrical and Electronics Engineers Inc. |
Pages | 665-670 |
Number of pages | 6 |
ISBN (Electronic) | 9798350393545 |
DOIs | |
State | Published - 2024 |
Event | 29th Asia and South Pacific Design Automation Conference, ASP-DAC 2024 - Incheon, Korea, Republic of Duration: Jan 22 2024 → Jan 25 2024 |
Publication series
Name | Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC |
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Conference
Conference | 29th Asia and South Pacific Design Automation Conference, ASP-DAC 2024 |
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Country/Territory | Korea, Republic of |
City | Incheon |
Period | 1/22/24 → 1/25/24 |
Bibliographical note
Publisher Copyright:© 2024 IEEE.