@inproceedings{229ce662c97f46d18d7d714e71432f3e,
title = "Robust Control Approach to Atomic Force Microscopy",
abstract = "The Imaging problem using an Atomic Force Microscope (AFM) is addressed in the framework of modern robust control. Subsequently stacked H ∞ and Glover McFarlane controllers are designed for high bandwidth and robustness. It is postulated that the sample profile can be accurately imaged without building explicit observers. Experimental results substantiate this claim.",
author = "Abu Sebastian and Salapaka, {Murti V.} and Cleveland, {Jason P.}",
year = "2003",
doi = "10.1109/CDC.2003.1271677",
language = "English (US)",
isbn = "0780379241",
series = "Proceedings of the IEEE Conference on Decision and Control",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "3443--3444",
booktitle = "Proceedings of the IEEE Conference on Decision and Control",
note = "42nd IEEE Conference on Decision and Control ; Conference date: 09-12-2003 Through 12-12-2003",
}