Scanning electrochemical microscopy with simultaneous independent topography

A new method to perform scanning electrochemical microscopy (SECM) and topography simultaneously is described here. The new method uses a conventional scanning microelectrode to sense species released by local electrochemical reactions on the surface of a sample, combined with shear-force feedback to maintain the probe at a constant distance from the surface of the material. By using shear-force feedback, larger electrochemical currents can be detected at the microelectrode because the probe is scanned at a closer distance from the surface of the sample. The new method has yielded high lateral resolution topography and SECM images are reported here.