Scanning Probe Microscopy

Murti V. Salapaka; Srinivasa M. Salapaka

doi:10.1109/MCS.2007.914688

Scanning Probe Microscopy

Murti V. Salapaka, Srinivasa M. Salapaka

Electrical and Computer Engineering

Research output: Contribution to journal › Article › peer-review

233 Scopus citations

Original language	English (US)
Pages (from-to)	65-83
Number of pages	19
Journal	IEEE Control Systems
Volume	28
Issue number	2
DOIs	https://doi.org/10.1109/MCS.2007.914688
State	Published - Apr 2008

Bibliographical note

Funding Information:
This research was partially supported by NSF under the grants ECS 0449310 CAR, ECS-0601571, ECS-0330224, CMS-0201516, and ECS-9733802. We wish to thank Kishan Baheti for facilitating workshops and sessions in scanning probe microscopy, which have led to fruitful collaborations among researchers from industry and academia.

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title = "Scanning Probe Microscopy",

author = "Salapaka, {Murti V.} and Salapaka, {Srinivasa M.}",

note = "Funding Information: This research was partially supported by NSF under the grants ECS 0449310 CAR, ECS-0601571, ECS-0330224, CMS-0201516, and ECS-9733802. We wish to thank Kishan Baheti for facilitating workshops and sessions in scanning probe microscopy, which have led to fruitful collaborations among researchers from industry and academia.",

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Scanning Probe Microscopy

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