Abstract
Vanadium pentoxide xerogel films spin-coated on nickel/silicon substrates have shown high electrochemical performance. In fact, more than 3 equiv of lithium V2O5 unit can be reversibly inserted between 3.5 and 1.6 V in aprotic electrolytes. The high insertion capacity coupled with the inexpensive and well-known preparation procedure make the material interesting for thin-film lithium battery and electrochromic device applications. In the present paper we report the characterization of such thin films based on X-ray diffraction (XRD), scanning electron microscopy (SEM), transmission electron microscopy (TEM), quartz crystal microbalance, optical, and electronic conductivity measurements. The spin-coated films are highly amorphous, with a small amount of ribbon stacking that is randomly oriented. The disorder is caused by the joint effect of high shear and rapid drying during spin coating.
Original language | English (US) |
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Pages (from-to) | 780-785 |
Number of pages | 6 |
Journal | Chemistry of Materials |
Volume | 7 |
Issue number | 4 |
DOIs | |
State | Published - Apr 1995 |