Structural Effects of Ti Underlayer on CoCrPt Magnetic Films

C. J. Sun; G. M. Chow; E. W. Soo; J. P. Wang; Y. K. Hwu; T. S. Cho; J. H. Je; H. H. Lee; J. W. Kim; D. Y. Noh

doi:10.1166/jnn.2001.035

Structural Effects of Ti Underlayer on CoCrPt Magnetic Films

C. J. Sun, G. M. Chow, E. W. Soo, J. P. Wang, Y. K. Hwu, T. S. Cho, J. H. Je, H. H. Lee, J. W. Kim, D. Y. Noh

Electrical and Computer Engineering

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Abstract

The effects of long-range and short-range orders of Ti underlayer thickness on the magnetic properties of sputtered Co ₇₂Cr ₂₁ Pt ₇ films were investigated using synchrotron X-ray scattering and X-ray absorption near-edge structure spectroscopy. The results were consistent with that of magnetic measurements and X-ray photoelectron spectroscopy. For thin Ti underlayers (10 nm), the oxidation of Ti and significant mixing of other elements within this underlayer did not promote texture development, further resulting in poor texturing of magnetic films and undesirable magnetic properties. Increased crystallinity and texture of metallic Ti in thicker underlayers enhanced the magnetic peak alignment and its properties.

Original language	English (US)
Pages (from-to)	271-273
Number of pages	3
Journal	Journal of Nanoscience and Nanotechnology
Volume	1
Issue number	3
DOIs	https://doi.org/10.1166/jnn.2001.035
State	Published - 2001

Keywords

Cocrpt films
Ti underlayer
X-ray scattering
XANES

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title = "Structural Effects of Ti Underlayer on CoCrPt Magnetic Films",

abstract = "The effects of long-range and short-range orders of Ti underlayer thickness on the magnetic properties of sputtered Co 72Cr 21 Pt 7 films were investigated using synchrotron X-ray scattering and X-ray absorption near-edge structure spectroscopy. The results were consistent with that of magnetic measurements and X-ray photoelectron spectroscopy. For thin Ti underlayers (10 nm), the oxidation of Ti and significant mixing of other elements within this underlayer did not promote texture development, further resulting in poor texturing of magnetic films and undesirable magnetic properties. Increased crystallinity and texture of metallic Ti in thicker underlayers enhanced the magnetic peak alignment and its properties.",

keywords = "Cocrpt films, Ti underlayer, X-ray scattering, XANES",

author = "Sun, {C. J.} and Chow, {G. M.} and Soo, {E. W.} and Wang, {J. P.} and Hwu, {Y. K.} and Cho, {T. S.} and Je, {J. H.} and Lee, {H. H.} and Kim, {J. W.} and Noh, {D. Y.}",

year = "2001",

doi = "10.1166/jnn.2001.035",

language = "English (US)",

volume = "1",

pages = "271--273",

journal = "Journal of Nanoscience and Nanotechnology",

issn = "1533-4880",

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TY - JOUR

T1 - Structural Effects of Ti Underlayer on CoCrPt Magnetic Films

AU - Sun, C. J.

AU - Chow, G. M.

AU - Soo, E. W.

AU - Wang, J. P.

AU - Hwu, Y. K.

AU - Cho, T. S.

AU - Je, J. H.

AU - Lee, H. H.

AU - Kim, J. W.

AU - Noh, D. Y.

PY - 2001

Y1 - 2001

N2 - The effects of long-range and short-range orders of Ti underlayer thickness on the magnetic properties of sputtered Co 72Cr 21 Pt 7 films were investigated using synchrotron X-ray scattering and X-ray absorption near-edge structure spectroscopy. The results were consistent with that of magnetic measurements and X-ray photoelectron spectroscopy. For thin Ti underlayers (10 nm), the oxidation of Ti and significant mixing of other elements within this underlayer did not promote texture development, further resulting in poor texturing of magnetic films and undesirable magnetic properties. Increased crystallinity and texture of metallic Ti in thicker underlayers enhanced the magnetic peak alignment and its properties.

AB - The effects of long-range and short-range orders of Ti underlayer thickness on the magnetic properties of sputtered Co 72Cr 21 Pt 7 films were investigated using synchrotron X-ray scattering and X-ray absorption near-edge structure spectroscopy. The results were consistent with that of magnetic measurements and X-ray photoelectron spectroscopy. For thin Ti underlayers (10 nm), the oxidation of Ti and significant mixing of other elements within this underlayer did not promote texture development, further resulting in poor texturing of magnetic films and undesirable magnetic properties. Increased crystallinity and texture of metallic Ti in thicker underlayers enhanced the magnetic peak alignment and its properties.

KW - Cocrpt films

KW - Ti underlayer

KW - X-ray scattering

KW - XANES

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EP - 273

JO - Journal of Nanoscience and Nanotechnology

JF - Journal of Nanoscience and Nanotechnology

IS - 3

ER -

Structural Effects of Ti Underlayer on CoCrPt Magnetic Films

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