Studying the Impact of Temperature Gradient on Electromigration Lifetime Using a Power Grid Test Structure with On-Chip Heaters

Yong Hyeon Yi; Chris Kim; Chen Zhou; Armen Kteyan; Valeriy Sukharev

doi:10.1109/IRPS48203.2023.10117811

Studying the Impact of Temperature Gradient on Electromigration Lifetime Using a Power Grid Test Structure with On-Chip Heaters

Yong Hyeon Yi, Chris Kim, Chen Zhou, Armen Kteyan, Valeriy Sukharev

Electrical and Computer Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

This work presents statistical data collected from 38 power grid test structures showing the detailed impact of temperature gradient on electro migration (EM) lifetime. The failure time, order, and location under different temperature gradients were compared to show that unexpected early EM failures can occur at temperature gradient regions due to accelerated tensile stress evolution inside the wire.

Original language	English (US)
Title of host publication	2023 IEEE International Reliability Physics Symposium, IRPS 2023 - Proceedings
Publisher	Institute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)	9781665456722
DOIs	https://doi.org/10.1109/IRPS48203.2023.10117811
State	Published - 2023
Event	61st IEEE International Reliability Physics Symposium, IRPS 2023 - Monterey, United States Duration: Mar 26 2023 → Mar 30 2023

Publication series

Name	IEEE International Reliability Physics Symposium Proceedings
Volume	2023-March
ISSN (Print)	1541-7026

Conference

Conference	61st IEEE International Reliability Physics Symposium, IRPS 2023
Country/Territory	United States
City	Monterey
Period	3/26/23 → 3/30/23

Bibliographical note

Funding Information:
ACKNOWLEDGMENT This work was supported in part by Semiconductor Research Corporation (SRC) through the Texas Analog Center of Excellence (TxACE).

Publisher Copyright:
© 2023 IEEE.

Keywords

Electromigration
on-chip heater
power grid
reliability
temperature gradient
TTF
void

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10.1109/IRPS48203.2023.10117811

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Yi, Y. H., Kim, C., Zhou, C., Kteyan, A., & Sukharev, V. (2023). Studying the Impact of Temperature Gradient on Electromigration Lifetime Using a Power Grid Test Structure with On-Chip Heaters. In 2023 IEEE International Reliability Physics Symposium, IRPS 2023 - Proceedings (IEEE International Reliability Physics Symposium Proceedings; Vol. 2023-March). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/IRPS48203.2023.10117811

Studying the Impact of Temperature Gradient on Electromigration Lifetime Using a Power Grid Test Structure with On-Chip Heaters. / Yi, Yong Hyeon; Kim, Chris; Zhou, Chen et al.
2023 IEEE International Reliability Physics Symposium, IRPS 2023 - Proceedings. Institute of Electrical and Electronics Engineers Inc., 2023. (IEEE International Reliability Physics Symposium Proceedings; Vol. 2023-March).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Yi, YH, Kim, C, Zhou, C, Kteyan, A & Sukharev, V 2023, Studying the Impact of Temperature Gradient on Electromigration Lifetime Using a Power Grid Test Structure with On-Chip Heaters. in 2023 IEEE International Reliability Physics Symposium, IRPS 2023 - Proceedings. IEEE International Reliability Physics Symposium Proceedings, vol. 2023-March, Institute of Electrical and Electronics Engineers Inc., 61st IEEE International Reliability Physics Symposium, IRPS 2023, Monterey, United States, 3/26/23. https://doi.org/10.1109/IRPS48203.2023.10117811

Yi YH, Kim C, Zhou C, Kteyan A, Sukharev V. Studying the Impact of Temperature Gradient on Electromigration Lifetime Using a Power Grid Test Structure with On-Chip Heaters. In 2023 IEEE International Reliability Physics Symposium, IRPS 2023 - Proceedings. Institute of Electrical and Electronics Engineers Inc. 2023. (IEEE International Reliability Physics Symposium Proceedings). doi: 10.1109/IRPS48203.2023.10117811

Yi, Yong Hyeon ; Kim, Chris ; Zhou, Chen et al. / Studying the Impact of Temperature Gradient on Electromigration Lifetime Using a Power Grid Test Structure with On-Chip Heaters. 2023 IEEE International Reliability Physics Symposium, IRPS 2023 - Proceedings. Institute of Electrical and Electronics Engineers Inc., 2023. (IEEE International Reliability Physics Symposium Proceedings).

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Studying the Impact of Temperature Gradient on Electromigration Lifetime Using a Power Grid Test Structure with On-Chip Heaters

Abstract

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Bibliographical note

Keywords

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