Summary abstract: Application of reflection high-energy electron diffraction to thin-film growth and characterization

P. I. Cohen; P. R. Pukite

doi:10.1116/1.574910

Summary abstract: Application of reflection high-energy electron diffraction to thin-film growth and characterization

P. I. Cohen, P. R. Pukite

Research output: Contribution to journal › Article › peer-review

Original language	English (US)
Pages (from-to)	2027-2028
Number of pages	2
Journal	Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Volume	5
Issue number	4
DOIs	https://doi.org/10.1116/1.574910
State	Published - Jul 1 1987
Externally published	Yes

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Copyright 2016 Elsevier B.V., All rights reserved.

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Summary abstract: Application of reflection high-energy electron diffraction to thin-film growth and characterization

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