Abstract
The surface potential imaging and profiling experiments by Kelvin probe force microscopy (KFM) was used to examine the role of contacts in bottom and top contact pentacene thin-film transistors (TFT). It was shown that KFM is sensitive to subsurface potential changes in the thin TFT accumulation layer, which was confined to the monolayers at the dielectric interfaces. The maps were used to identify bottlenecks to charge transport in conjunction with drain current measurements. The results demonstrates the utility of KFM for generating potential maps of operating pentacene TFT.
Original language | English (US) |
---|---|
Pages (from-to) | 5539-5541 |
Number of pages | 3 |
Journal | Applied Physics Letters |
Volume | 83 |
Issue number | 26 |
DOIs | |
State | Published - Dec 29 2003 |