Toward quantitative estimation of material properties with dynamic mode atomic force microscopy: A comparative study

Sayan Ghosal, Anil Gannepalli, Murti Salapaka

Research output: Contribution to journalArticlepeer-review

2 Scopus citations

Abstract

In this article, we explore methods that enable estimation of material properties with the dynamic mode atomic force microscopy suitable for soft matter investigation. The article presents the viewpoint of casting the system, comprising of a flexure probe interacting with the sample, as an equivalent cantilever system and compares a steady-state analysis based method with a recursive estimation technique for determining the parameters of the equivalent cantilever system in real time. The steady-state analysis of the equivalent cantilever model, which has been implicitly assumed in studies on material property determination, is validated analytically and experimentally. We show that the steady-state based technique yields results that quantitatively agree with the recursive method in the domain of its validity. The steady-state technique is considerably simpler to implement, however, slower compared to the recursive technique. The parameters of the equivalent system are utilized to interpret storage and dissipative properties of the sample. Finally, the article identifies key pitfalls that need to be avoided toward the quantitative estimation of material properties.

Original languageEnglish (US)
Article number325703
JournalNanotechnology
Volume28
Issue number32
DOIs
StatePublished - Jul 19 2017

Keywords

  • atomic force microscopy
  • material characterization
  • nanotechnology
  • signals and systems

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