TY - GEN
T1 - What happens when circuits grow old
T2 - 2013 International Symposium on VLSI Technology, Systems and Application, VLSI-TSA 2013
AU - Sapatnekar, Sachin S.
PY - 2013
Y1 - 2013
N2 - As CMOS technologies have shrunk to tens of nanometers, aging problems have emerged as a major challenge. There has been tremendous progress in developing new methods for modeling and diagnosing reliability at the level of individual transistors, but much less work on propagating these models to higher levels of abstraction to analyze and optimize the reliability of larger circuits. This talk will provide an introduction to various circuit aging mechanisms and will then discuss research that develops computer-aided design techniques for estimating and enhancing the reliability of large digital circuits, examining solutions that could practically be applied to analyze or improve the lifetime of a design while maintaining consistency to accurate device-level models and the associated physics.
AB - As CMOS technologies have shrunk to tens of nanometers, aging problems have emerged as a major challenge. There has been tremendous progress in developing new methods for modeling and diagnosing reliability at the level of individual transistors, but much less work on propagating these models to higher levels of abstraction to analyze and optimize the reliability of larger circuits. This talk will provide an introduction to various circuit aging mechanisms and will then discuss research that develops computer-aided design techniques for estimating and enhancing the reliability of large digital circuits, examining solutions that could practically be applied to analyze or improve the lifetime of a design while maintaining consistency to accurate device-level models and the associated physics.
UR - http://www.scopus.com/inward/record.url?scp=84881159578&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84881159578&partnerID=8YFLogxK
U2 - 10.1109/VLSI-TSA.2013.6545621
DO - 10.1109/VLSI-TSA.2013.6545621
M3 - Conference contribution
AN - SCOPUS:84881159578
SN - 9781467330817
T3 - 2013 International Symposium on VLSI Technology, Systems and Application, VLSI-TSA 2013
BT - 2013 International Symposium on VLSI Technology, Systems and Application, VLSI-TSA 2013
Y2 - 22 April 2013 through 24 April 2013
ER -