Anomalous Nernst and Seebeck coefficients in epitaxial thin film Co2MnAlxSi1-x and Co2FeAl

A. T. Breidenbach; H. Yu; T. A. Peterson; A. P. Mcfadden; W. K. Peria; C. J. Palmstrøm; P. A. Crowell

doi:10.1103/PhysRevB.105.144405

Anomalous Nernst and Seebeck coefficients in epitaxial thin film Co2MnAlxSi1-x and Co2FeAl

A. T. Breidenbach, H. Yu, T. A. Peterson, A. P. Mcfadden, W. K. Peria, C. J. Palmstrøm, P. A. Crowell

Physics and Astronomy (Twin Cities)

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Abstract

We have measured the Seebeck and anomalous Nernst coefficients and corresponding transverse and longitudinal thermoelectric conductivities from 2 to 400 K in thin film (thickness t∼10 nm) Co2MnAlxSi1-x (0≤x≤1) and Co2FeAl grown by molecular beam epitaxy (MBE). A large (-14Am-1K-1 at 300 K) anomalous component of the transverse thermoelectric conductivity is observed in Co2MnAl, especially as contrasted to Co2MnSi (0.28 Am-1K-1 at 300 K). This enhancement is likely due to Weyl points close to the Fermi level of Co2MnAl which disappear as x decreases.

Original language	English (US)
Article number	144405
Journal	Physical Review B
Volume	105
Issue number	14
DOIs	https://doi.org/10.1103/PhysRevB.105.144405
State	Published - Apr 1 2022

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abstract = "We have measured the Seebeck and anomalous Nernst coefficients and corresponding transverse and longitudinal thermoelectric conductivities from 2 to 400 K in thin film (thickness t∼10 nm) Co2MnAlxSi1-x (0≤x≤1) and Co2FeAl grown by molecular beam epitaxy (MBE). A large (-14Am-1K-1 at 300 K) anomalous component of the transverse thermoelectric conductivity is observed in Co2MnAl, especially as contrasted to Co2MnSi (0.28 Am-1K-1 at 300 K). This enhancement is likely due to Weyl points close to the Fermi level of Co2MnAl which disappear as x decreases.",

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T1 - Anomalous Nernst and Seebeck coefficients in epitaxial thin film Co2MnAlxSi1-x and Co2FeAl

AU - Breidenbach, A. T.

AU - Yu, H.

AU - Peterson, T. A.

AU - Mcfadden, A. P.

AU - Peria, W. K.

AU - Palmstrøm, C. J.

AU - Crowell, P. A.

PY - 2022/4/1

Y1 - 2022/4/1

N2 - We have measured the Seebeck and anomalous Nernst coefficients and corresponding transverse and longitudinal thermoelectric conductivities from 2 to 400 K in thin film (thickness t∼10 nm) Co2MnAlxSi1-x (0≤x≤1) and Co2FeAl grown by molecular beam epitaxy (MBE). A large (-14Am-1K-1 at 300 K) anomalous component of the transverse thermoelectric conductivity is observed in Co2MnAl, especially as contrasted to Co2MnSi (0.28 Am-1K-1 at 300 K). This enhancement is likely due to Weyl points close to the Fermi level of Co2MnAl which disappear as x decreases.

AB - We have measured the Seebeck and anomalous Nernst coefficients and corresponding transverse and longitudinal thermoelectric conductivities from 2 to 400 K in thin film (thickness t∼10 nm) Co2MnAlxSi1-x (0≤x≤1) and Co2FeAl grown by molecular beam epitaxy (MBE). A large (-14Am-1K-1 at 300 K) anomalous component of the transverse thermoelectric conductivity is observed in Co2MnAl, especially as contrasted to Co2MnSi (0.28 Am-1K-1 at 300 K). This enhancement is likely due to Weyl points close to the Fermi level of Co2MnAl which disappear as x decreases.

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Anomalous Nernst and Seebeck coefficients in epitaxial thin film Co2MnAlxSi1-x and Co2FeAl

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