Anomalous Nernst and Seebeck coefficients in epitaxial thin film Co2MnAlxSi1-x and Co2FeAl

A. T. Breidenbach, H. Yu, T. A. Peterson, A. P. Mcfadden, W. K. Peria, C. J. Palmstrøm, P. A. Crowell

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Engineering & Materials Science

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